Suitable for non-destructive measurement of film or any sample attached to the reflective surface.
There are different incident angles to choose.
1. Used for films or any samples attached to reflective surfaces, such as lubricants on the surface of hard disks, polymers coated on the surface of food containers, etc.
2. Light incident angle can be adjusted.
3. Polarizing filters of various materials can be selected.
Applicable to: metal surface contamination analysis (for example: silicon wafer), ultra-thin film analysis (Ultra-thin film), monomolecular layer (mono molecular layer) research, used with FTIR.
1. Variable angle reflective attachment
2. Reflective attachment-30° incident angle
3. Reflective attachment-80° incident angle